Patents
Here are the two patents that I co-authored when working for CEA/INES :
WO2020025625A1 : Analysis of defects of at least one type from among a plurality of types of defects between at least two samples #
This first patent builds on previous work done in the LHET lab at INES to get a global defectivity metric from a photoluminescence measurement of a photovolataic cell. Besides introducing new metrics, my main contribution is to introduce a system of so called "minimaps", which are small matrices that summarise the defectivity information at the local scale in a compact form. The minimaps are then used for clustering analysis.
I recommend reading the proceedings of PVSEC 2020.
WO2022084627A1 : Device for measuring via photoluminescence and transmission #
This second patent is about a setup to take photoluminescence measurements with a light background, using an LED array as a backlight. This makes detection of the cell edge easier and thus more precise. The patent also introduces a method to quantify the defectivity at the edge of the cell, which is my main contribution here (besides fabricating the prototype device).